Clément Lafond: Advanced EBSD Pattern Indexing and Analysis for Real-Time Phase Transformation Studies

Under the aegis of the Medicis programme

Abstract

Recent advancements in Electron Backscatter Diffraction (EBSD) cameras from traditional CCD and CMOS sensors to cutting-edge, high-speed direct electron detectors are revolutionizing in situ characterization. These developments include increasingly sophisticated mechanical and temperature in situ stage loaders, enabling dynamic, real-time observations of phase transformations under diverse loading and thermal conditions. Such capabilities call for equally advanced pattern indexing and analysis approaches that can handle large data volumes, remain robust to noise and deformationinduced pattern variability, and support multi-phase sample analyses. This talk will present three complementary methods addressing these challenges (see downloadable abstract).

To attend on teams

It is also possible to attend the seminar on Microsoft Teams.